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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Arun, N. | - |
dc.contributor.author | Vinod Kumar, K. | - |
dc.contributor.author | Mangababu, A. | - |
dc.contributor.author | Nageswara Rao, S.V.S., | - |
dc.contributor.author | Pathak, A.P. | - |
dc.date.accessioned | 2019-10-25T11:03:11Z | - |
dc.date.available | 2019-10-25T11:03:11Z | - |
dc.date.issued | 2019 | - |
dc.identifier.citation | Radiation Effects and Defects in Solids 174 (1-2) 2019 | en_US |
dc.identifier.issn | 10420150 | - |
dc.identifier.uri | http://dspace.cus.ac.in/jspui/handle/1/6445 | - |
dc.language.iso | en_US | en_US |
dc.title | Influence of the bottom metal electrode and gamma irradiation effects on the performance of HfO<inf>2</inf>-based RRAM devices | en_US |
dc.type | Article | en_US |
Appears in Collections: | Publication indexed in Scopus |
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